Deep learning at your fingertips – the new HALCON version is here: HALCON 17.12, named after its release date in December 2017. This release includes an extensive set of cutting-edge deep learning functions, that can be instantly applied in industrial settings.
It is the first time that customers can train CNNs (Convolutional Neural Networks) with MVTec HALCON on the basis of deep learning algorithms, using sample pictures of their specific application. Thus, the resulting networks can be highly optimized to fit your needs. With this, image data can now be classified easily and precisely. Thus, users can reduce programming requirements and can save both time and money. Furthermore, detection rates and classification results have become even better and more robust.
The new deep learning feature is fully integrated into the HALCON machine vision library. Consequently, customers also benefit from the library’s immense range of advantages, along with regular updates, continuous innovation, and competent support.
In addition to the mentioned deep learning technologies, HALCON 17.12 offers many other new features, product improvements, and revised functions. For example, the software enables the users to inspect specular and partially specular surfaces to detect defects by applying the principle of deflectometry. This method uses the aforementioned specular reflections by observing mirror images of known patterns and their deformations on the surface.
The new release also simplifies the daily work of HALCON developers, since it is now much easier to integrate the HDevEngine into the developer's application. Another highlight is the improved automatic text reader, which has become even better at detecting and reading letters and numbers that touch each other.
Moreover, HALCON 17.12 offers a new method to fuse the data from different 3D point clouds into one unified model. This 3D-based, cutting-edge technology simplifies the post-processing of such point clouds through a much more accurate reconstruction of objects. This is important for processes such as reverse engineering. For example, if there is no CAD model available, or if objects must be analyzed more precisely regarding their 3D properties.