Smart, Fast, and AI-Powered: MVTec at Hannover Messe 2025!
Visit us at Hannover Messe 2025 and experience cutting-edge machine vision technologies live!
As a leading provider of machine vision software, MVTec presents innovative solutions for industrial applications. Be inspired by how artificial intelligence (AI) and deep learning are revolutionizing automation and quality assurance.
Date: March 31 –April 04, 2025
Location: Hannover Messe, Hall 9, Booth G24
MVTec is part of the official AI Tour
MVTec will be an exhibitor in the official AI Tour at Hannover Messe 2025! As part of these guided tours, we will showcase our latest AI-powered technologies in action. Don’t miss the opportunity to join one of the tours and gain exclusive insights into our powerful demos. More details on registration will follow.
Our Live Demonstrations
AI Anomaly Detection
This demo showcases the optical end-of-line inspection of the positive terminal of a cylindrical battery cell using MVTec’s deep learning technology Global Context Anomaly Detection. The solution is ideal for robust quality inspection, defect detection, and completeness analysis. With the anomaly detection functionality in MVTec MERLIC, scratches, contamination, and deformations on battery cells are reliably detected—platform-independent and highly flexible. Additionally, this demo highlights the seamless integration into the Siemens Industrial Edge Ecosystem, enabling scalable and efficient quality control.
AOI Wafer Inspection
This demonstration presents a high-precision inspection technology for 12-inch wafers, capable of detecting even the smallest anomalies such as scratches, tiny cracks, and dust particles. Our advanced image processing techniques enable precise and fast image alignment, along with a trained variation model that identifies various defects on the chips. Moreover, with HALCON’s toolboxes, both rule-based and deep-learning-based methods can be implemented to detect wafer anomalies. From front-end to back-end inspection, HALCON offers a wide range of technologies, including OCR, 3D measurement, and much more.
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