Meet the MVTec experts at the UKIVA in Coventry from June 20 to 21. Listen to Johannes Behrends’ presentation “Easy Quality Assurance With Deep Learning?”
MVTec invites you to come and engage with us at our booth 37 at the Machine Vision Conference in Coventry, UK.
Live Demonstration: Stop by our live demonstration and discover the power of HALCON with deep learning acceleration.
“Easy Quality Assurance With Deep Learning?” (Tuesday, 20 June at 11:30 am and Wednesday, 21 June at 12:00 pm)
In visual inspection tasks, the appearance of defects often cannot be predicted. Over the last years, deep learning methods have been providing the means to develop parameter-free customer applications. However, the challenge has shifted to provide the appropriate data. A particular challenge is to find defects even if no or just a few data of that class is available. This presentation will show an easy-to-use way to master this challenge based on Deep Learning Global Context Anomaly Detection. By a practical example, an end-to-end workflow from the data to a deployable deep learning application will be presented using MVTec’s Deep Learning Tool and MERLIC.
Please stop by and find out more about MVTec’s latest solutions in HALCON and MERLIC.