With the new features MVTec software users can benefit from significant time-saving potentials and improved flexibility.
Enhancements of MVTec HALCON’s 3D technologies with deep learning algorithms now allow for robustly detecting gripping surfaces on arbitrary objects. This enables faster and thus more cost-efficient implementations of typical applications, e.g., in logistics. At our booth, we showcase this brand-new feature with a machine-vision-based robotics system.
The new "Global Context Anomaly Detection" is a one-of-a-kind technology, which takes into account the logical content of the entire image. This deep-learning-based technology makes it possible to detect entirely new variants of anomalies like missing, deformed, or incorrectly arranged components. It presents completely new possibilities: For example, the inspection of printed circuit boards in the semiconductor production or the inspection of imprints. The feature is already available in HALCON and will be introduced in MERLIC with the next release.
Learn more about MVTec’s comprehensive machine vision software portfolio and enjoy a cup of coffee from our barista at our booth!
Redeem your free ticket now with this code MEETMVTEC2022.