A primary focus will be new features in the context of deep learning and 3D vision. Dr. Olaf Munkelt, Managing Director of MVTec, comments: “After a long period without trade shows, we are looking forward to interacting in person with our customers, partners, and other interested parties again. Backed by a quarter century of machine vision experience, we’ll provide an impressive demonstration of our technology leadership. With our customers as sparring partners and our strong team of experts, we’ll continue to be a stable force in the global machine vision market for the next 25 years.”
MVTec will use its trade fair appearance to introduce some brand-new technologies at automatica. These include the Global Context Anomaly Detection deep learning feature, which will be introduced with the release of MVTec HALCON 22.05. For the first time, this allows logical anomalies such as incorrectly arranged components to be detected in images. The technology can be used, for example, as part of quality control for completeness checks and defect detection. In a live demonstration, MVTec experts will show how this new feature can be used to inspect electronic components on printed circuit boards (PCBs), for detecting both local, structural defects, such as scratches, and logical defects.
First-time combination of 3D vision and deep learning for bin picking
In addition, MVTec will present at the trade show a deep-learning-based bin-picking application. This combines for the first time 3D vision and deep learning, with the goal of robustly detecting gripping surfaces on arbitrary objects. Unlike typical bin-picking applications, this eliminates the need to train object surfaces. Therefore, no prior knowledge of the specific objects is required. This allows for a faster and thus much more cost-efficient implementation of typical applications, such as those in the logistics industry. In a live demonstration with a machine-vision-based robotics system, MVTec will show how, in the future, MVTec HALCON can be used to grasp, move, and put down objects with unknown shapes.
MVTec will also present further demos in cooperation with long-standing partners. At the booth of IDS Imaging Development Systems, for example, it will be demonstrated how MVTec software and IDS cameras can read bar codes and data codes regardless of orientation – even if the module width is less than one pixel or the code is partially obscured.
Machine vision community meets for a get-together
This year, MVTec also offers an attractive supporting program: To celebrate the company’s 25th anniversary, on June 22 MVTec is inviting long-time companions, existing customers, partners, and interested parties to a get-together at the Kunst Location not far from the Messe München trade show grounds. Visitors can look forward to an entertaining and multifaceted program that will provide interesting insights into the history and future of machine vision from different perspectives as well as an amusing retrospective of MVTec’s machine vision history. Participants will also be enchanted by a magical special guest. The event will be rounded off by relaxed networking in a summery atmosphere accompanied by food, beverages, and music. Interested parties can register for free until June 14 at www.mvtec.com/25years.