MVTec Innovation Day:
Discover the full Potential of Machine Vision

Lighting Matters: Solving Challenging Machine Vision Tasks with the Right Lighting Systems

Even with the rapid development of AI technologies, we must not overlook the basics—like the lighting system. This presentation, in collaboration with Wenglor, blends fundamental lighting principles with advanced strategies, offering insights even for experts. We discover how to design flexible, optimal lighting configurations for your applications, easily integrated with MERLIC.

• Ulf Schulmeyer
• Xin Jin
• Christoph Wagner (Wenglor MEL GmbH)

Production of next-generation satellites: How machine vision enhances the performance and capabilities of a 6-axis robot

Satellite manufacturing demands extremely precise specifications, often in large workspaces where robots face limitations in absolute accuracy. Discover how AKEOPLUS solved this with HALCON, integrating vision systems, applied mathematics, and servo loop technology to enable robots to achieve greater accuracy.

• Maxime Motisi (AKEOPLUS)
• Boris Bocquet (AKEOPLUS)

Future Log: Fast Word Alignment for Robust DeepOCR Recognition

Loosely cropped words pose a challenge for DeepOCR’s recognition accuracy, often leading to misreads. In this session, we present a fast alignment module that efficiently adjusts loosely cropped words, enabling DeepOCR to perform robust and accurate recognition.

• Philipp Haertinger
• Markus Glitzner
• Tim Parbs 

Poster Pitches

Expand your knowledge with a variety of inspiring topics off the main stage. Discover what’s ahead for MVTec products and projects, and connect in meaningful discussions.

A Sneak Peek at HDevelopEVO: The Next Evolution of Machine Vision IDEs

Get an exclusive sneak peek at HDevelopEVO, the latest IDE in machine vision prototyping, designed to streamline workflows and enhance flexibility. Learn how to maximize its benefits today and see how it will shape the development of future machine vision applications.

• Hannes Cmarits
• Tobias Wachs
• Jan Gaertner

Hands-On Wafer Defect Detection: Automated Parameter Estimation with Rule-Based Algorithms

Watch our step-by-step demonstration as we tackle the challenges of wafer defect detection. See how HALCON’s latest shape-based matching feature delivers fast, accurate, and robust results that you can apply directly to your use case.

• Andreas Hofhauser
• Coco Rogers 

Deep 3D Matching

With the introduction of HALCON 24.11, Deep 3D Matching introduces a new level of robust 3D pose estimation for complex applications. This session will explore practical use cases, showcase its advantages over traditional methods, and provide an outlook on the feature’s future developments.

• Bertram Drost
• Andreas Zeiler

More information coming soon...