From June 21-24, 2022, you can meet us again in person at automatica in Munich. We look forward to showing you the latest developments of our machine vision software products HALCON, MERLIC, and Deep Learning Tool.
MVTec will use its trade fair appearance to introduce some brand-new technologies at automatica. These include the Global Context Anomaly Detection deep learning feature, which will be introduced with the release of MVTec HALCON 22.05. For the first time, this allows logical anomalies such as incorrectly arranged components to be detected in images. The technology can be used, for example, as part of quality control for completeness checks and defect detection. In a live demonstration, MVTec experts will show how this new feature can be used to inspect electronic components on printed circuit boards (PCBs), for detecting both local, structural defects, such as scratches, and logical defects.
Learn how machine learning, vision, and robotics alter the industry and elevate automation to the next level. Therefore, join the discussion " munich i CEO Round Table: "Seeing and feeling the world: Unlocking perception"". Here, Dr. Olaf Munkelt and other prominent figures in the field will discuss the future and current deficiencies of the sector.
In addition, MVTec will present at the trade show a deep-learning-based bin-picking application. This combines for the first time 3D vision and deep learning, with the goal of robustly detecting gripping surfaces on arbitrary objects. Unlike typical bin-picking applications, this eliminates the need to train object surfaces. Therefore, no prior knowledge of the specific objects is required. This allows for a faster and thus much more cost-efficient implementation of typical applications, such as those in the logistics industry. In a live demonstration with a machine-vision-based robotics system, MVTec will show how, in the future, MVTec HALCON can be used to grasp, move, and put down objects with unknown shapes. If you are further interested in how to implement and optimize Deep Learning in an industrial environment, we highly recommend Christian Ecksteins talk "Deep Learning in practice: The move toward data-centric Deep Learning".
MVTec will also present further demos in cooperation with long-standing partners. At the booth of IDS Imaging Development Systems, for example, it will be demonstrated how MVTec software and IDS cameras can read bar codes and data codes regardless of orientation – even if the module width is less than one pixel or the code is partially obscured.
Also save the date for our networking event on June 22, at which we want to celebrate MVTec's 25th birthday with you. The event will start late in the afternoon and will take place close to the Munich Trade Fair Center.