Success Story

Machine vision improves the measuring process of precision and micro components

The precise inspection of very small precision components, for example in watchmaking, is a challenge. Petitpierre, the Swiss specialist for high-precision technology, has developed sophisticated applications with which micromechanical components can be cleaned and measured precisely during the production process. MVTec HALCON supplies the appropriate machine vision algorithms for this: Technologies, such as matching and contour extraction, ensure precise measurement results.
HALCON
Matching
Measuring

Measuring and inspecting super-small parts repetitively, precisely, and at high speeds are key requirements for the watchmaking industry as well as all industries dealing with micro components, as they help to avoid production rejects and to produce precise pieces.

Petitpierre SA, headquartered in Cortaillod, Switzerland, is a specialist in sophisticated microtechnology that committed itself to making this ideal a reality – with the help of machine vision. Founded in 1973, the family-owned company’s portfolio includes complex measuring applications for the watchmaking, jewelry, medical, and aerospace industries. The company also develops and produces high-precision systems for the automated assembly of high-end microtechnical components as well as sophisticated watchmaking tools.

One of Petitpierre’s customers is KIF Parechoc, a flagship company in the Swiss watchmaking industry. To comprehensively improve and automate their processes, Petitpierre developed a contactless inspection and cleaning system for precision mechanical components. To elevate the quality of the processes to a new level, the objective was to optimize the measuring of these parts. The major challenge was to perform a highly precise and fast series of measurements under harsh production conditions with just one click. This challenge could be overcome with MVTec HALCON.

Process relocation from the clean room to the production facility

In the past, several systems carried out these measuring processes, including contact measurement, in a clean environment. Now they were to be moved directly to the production plant to reduce the effort and ensure continuous process chains. Advanced measurement technology was needed to meet the diverse requirements. Machine vision not only made it possible to automate the entire process seamlessly with minimal effort, but also increased speed and precision in the measuring process.

Efficient combination of cleaning and measuring – lumen and drop powered by machine vision

The solution implemented by Petitpierre is a dual system, combining its products drop and lumen and empowering them with machine vision software. drop is a device for the automatic cleaning and drying of precision parts that ensures the optimum repeatability of cleaning quality. lumen is a telecentric optical device for the intelligent, automatic, and highly accurate measurement of precision micromechanical parts. In the first step, the components are being cleaned and dried in drop, then transferred to lumen via a vacuum gripper. There, the integrated machine vision software detects them automatically and measures them. Once all parts have gone through the measuring process, the measurement results are seamlessly exported into the KIF Parechoc quality control software, where they are available for the rest of the process chain.

High-precision measurement thanks to matching technologies

MVTec HALCON is used as the machine vision software within the system. Its shape-based 2D matching technologies can identify and locate the tiny parts precisely so that they can be picked up with the vacuum gripper and measured with sub-micrometer precision. In detail, diameters, lengths, concentricity, radiuses, and angles are measured and inspected with subpixel accuracy, using the technology “subpixel threshold”. In addition, MVTec HALCON facilitates the precise camera calibration of the lumen system.

Precise mapping of telecentric optics with HALCON

Another advantage: MVTec HALCON is able to meet the special requirements of telecentric optics – as used in Petitpierre’s lumen system – with precision right out of the box. The 360-degree measurement of the object means that there is no perspective distortion that would involve time-consuming corrections afterwards. This paves the way for a particularly high level of measurement accuracy.

Fully automated, much faster, and more accurate: all goals achieved

“MVTec HALCON is the ideal machine vision software to overcome the challenges we were facing. It not only offers the required accuracy and speed of detection, but also enables inspections that are completely contactless. Since we can now start the whole inspection process with a single click, we reached the goal to make it much faster. As a result, KIF Parechoc is able to cut costs and raise productivity to a new level,” concludes Thomas Majoulet, Head of Metrology at Petitpierre.

Further articles

Visualize Object Model 3D
Improve your surface-based matching with two helpful features
Do you sometimes have objects, which have rather small symmetry-breaking elements (such as small boreholes on an object)? Does your surface-based 3D matching not find the correct orientation?
Read more
Developers Corner
Deep OCR Interface
Deep OCR recognition training – the next level
HALCON’s Deep OCR is very powerful and can detect and recognize text in various industrial scenes. However, what if you have a special font, or want to read foreign characters? With HALCON 22.05 it is possible to train the recognition model to read s…
Read more
Developers Corner
Fitted primitives distance threshold
Metrology Model – Quality of Fit
"For most applications, the standard parameter values are sufficient." This sentence is often read in the HALCON Solution Guide. But what if the results do not meet your expectations? The Metrology Model allows lightning-fast measurement of geometric…
Read more
Developers Corner
Review of Acquisition Modes
This article gives an overview of HALCON’s image acquisition modes, explaining how continuous, triggered, and synchronous acquisition work, and clarifying common misconceptions for practical applications.
Read more
Developers Corner
Deep OCR – Tips and Tricks
Have you already experienced the performance boost by using Deep OCR compared to the classical rule‑based approaches? In this article, we’ll show you practical tips and tricks to further improve your Deep OCR results.
Read more
Developers Corner
Easy text and code reading with MERLIC standard tools
If you want to build an MVApp that reads for example QR codes or bar codes you can do so with just a few clicks. You can even combine the tools to get all available information printed on a product in different formats without the need for programmin…
Read more
Developers Corner
About MVTec's Heatmap
Imagine you intend to deliver a HALCON deep-learning-based classification application. And you are about to evaluate a trained model. You are therefore looking for feedback about this model, i.e. about its performances, biases, and other possible def…
Read more
Developers Corner
Gabor filter: What is it for?
Gabor filters, which are well known in the realm of time series analyses, can also be used in HALCON for 2D image analysis. They are particularly useful for detecting textures, patterns, and orientations in complex images.
Read more
Developers Corner
Introduction to new sub-pixel feature of bar code reader
Do you have small resolution bar codes to read but don't get any good results? Then please try our new feature – the subpixel bar code reader.
Read more
Developers Corner
Introduction to XYZ-Mappings (part 2)
This technical article continues our introduction to XYZ-mappings. In the last article, we answered the question "What are XYZ-mappings?" and gave a short preview towards "Why is using XYZ-mappings beneficial for many 3D applications?". Today, we wil…
Read more
Developers Corner
Introduction to XYZ-Mappings (part 1)
This technical article explores the benefits of XYZ-mappings in HALCON, showing how they increase speed, flexibility, and ease of use for many 3D applications.
Read more
Developers Corner
Deep learning: Why is the dataset key for a success result?
Deep learning success starts with the dataset: Learn why acquiring high-quality, well-labeled training data is crucial for reliable classification, detection, segmentation, and anomaly detection in your machine vision applications.
Read more
Developers Corner
How to prepare 3D height images for further processing with MERLIC’s standard tools
Learn how to prepare 3D height images in MERLIC for further processing: convert non-byte images to byte images to enable alignment, embossed text reading, and defect detection with standard easyTouch tools.
Read more
Developers Corner
Deflectrometry demo HALCON
Inspection of specular surfaces with deflectometry in HALCON
Inspect flat and curved reflective surfaces quickly and reliably with HALCON deflectometry: detect scratches, dents, and other defects with synchronized image acquisition and flexible image processing.
Read more
Developers Corner
Deep Learning classifier HALCON
Training a deep learning classifier with HALCON on the embedded board Jetson TX2
Learn how to train a deep learning classifier with HALCON on both a PC and an embedded Jetson TX2 board, from image acquisition to model training and inference, for efficient machine vision applications.
Read more
Developers Corner
Add touch input to the HSmartWindowControlWPF
Learn how to easily add touch input, including pinch-to-zoom, to the HSmartWindowControlWPF in HALCON, leveraging WPF’s built-in multi-touch events for intuitive image control.
Read more
Developers Corner
Increasing Speed in Deflectometry Set-ups
Discover three approaches to increase speed in deflectometry setups, from simple software-based synchronization to hardware triggers and FPGA-based real-time control, enabling faster and more precise inspection of reflective surfaces.
Read more
Developers Corner
HDevelop matching assistant speedup greediness
Speeding up shape-based matching with "Greediness"
Learn how the 'Greediness' parameter in shape-based matching balances speed and detection completeness, enabling faster searches while maintaining robust results in HALCON.
Read more
Developers Corner
Best practice for classification and OCR
Discover best practices for setting up classification and OCR in HALCON using the HDevelop OCR Training File Browser – quickly review, correct, and optimize your training data to improve segmentation and classification results.
Read more
Developers Corner
Rejection all classes 1.5
How to use rejection classes in MVTec HALCON
Learn how to handle outlier samples in MVTec HALCON by using rejection classes in MLP classifiers – automatically generate samples outside the training classes to improve classification reliability.
Read more
Developers Corner
MVTec Software