July 10, 2025 | On-demand Webinar, HALCON

How to maximize the yield in wafer production

Inspecting wafers is extremely challenging due to their reflective surfaces, microscale defects, and the need for high precision. This is where machine vision makes the difference: by enabling automated, robust, and highly efficient optical inspection processes.

Watch the webinar to discover how advanced vision technologies are transforming wafer inspection and driving quality as well as throughput in semiconductor manufacturing. Questions straight from the industry, no slides – just solutions.

What you’ll learn:

How Machine Vision can be used to detect defects on a wafer, showing a live demo
Which technologies in MVTec HALCON can be used to maximize the yield
How we can support you to start with an automated optical inspection

Who should watch:

Engineers & technical leads exploring automation solutions in the semiconductor industry and beyond
Project managers and decision-makers looking to deepen their knowledge or explore new applications

Please fill out the form below to watch the webinar:

Published on: July 10, 2025

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